GAERTNER L116-C8 Variable Angle Ellipsometer

No. 2496

* Automatic highly precise measurements of film thickness and refractive index.
* Tilt-free, focus free, hands-off operation for similar wafers
* 15 Micron measuring spot standard
* Combination tilt/viewing scope standard
* Variable angle for difficulty to measure and near period films
* Trouble-free, no moving parts patentend StokesMeters measurement head
* Simple, compact tabletop instrument
* Wafer size up tu 200mm (8")
* Compaq Prolinea 590 PC with Windows Software, 17" TFT HP Monitor